Faculty

Juan Ren

  • Assistant Professor
  • Mechanical Engineering

Main Office

2030 Black Engr
Ames, IA 50011
Phone: 515-294-1805




Education

  • PhD, Mechanical Engineering, Rutgers University, 2015
  • BS, Mechanical Engineering, Xi’an Jiaotong University, 2009

Interest Areas

  • Nanoscale probe-based broadband biomechanics characterization
  • High-speed imaging and broad-band viscoelasticity spectroscopy of soft and biological materials
  • System-inversion based feedforward-feedback control, optimal control, and iterative control theory and implementation to nanotechnology

Selected Publications

  • Ren, J., Huang, H., Zheng, X., and Zou, Q. , “Study of the Effects of Anticancer Drugs on the Rate-dependent Elastic Modulus of Human Prostate Cancer Cell using Atomic Force Microscope”, PLOS ONE, 10(5): e0126107.
  • Ren, J., and Zou, Q., “High-Speed Adaptive Contact-Mode Atomic Force Microscopy Imaging with Near-Minimum-Force”, Review of Scientific Instruments, 85(7), 073706, 2014.
  • Ren, J., Zou, Q. , Li, B., and Lin, Z., “High-speed atomic force microscope imaging: Adaptive multiloop mode”, Physical Review E, 90(1), 012405, 2014.
  • Ren, J., and Zou, Q. , “A Control-based Approach to Accurate Nanoindentation Quantication in Broadband Nanomechanical Measurement using Scanning Probe Microscope”, IEEE Transactions on Nanotechnology, 13(1), 46 – 54, 2014.
  • Ren, J., Yu, S., Gao, N., and Zou, Q., “Indentation quantication for in-liquid nanomechanical measurement of soft material using an atomic force microscope: Rate-dependent elastic modulus of live cells”, Physical Review E, 88(5), 052711, 2013.
  • Ren, J., Mousavi, A., Li, X., Zou, Q., Erina, N., and Su, C., “Enhanced measurement of broad-band nanomechanical property of polymers using atomic force microscope”, Applied Physics Letters, 102(18), 183116, 2013.